Publications

Electronic & Energy Device Lab

Selected publication

The Origin of Excellent Gate-Bias Stress Stability in Organic Field-Effect Transistors Employing Fluorinated-Polymer Gate Dielectrics

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작성자 최고관리자 작성일 25-02-24 16:19

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Author
J. Kim,+ J. Jang,+ K. Kim, H. Kim, S. H. Kim, and C. E. Park
Journal
Adv. Mater.
Vol
26, 7241-7246 (2014)